A low dark current stacked CMOS-APS for charged particle imaging

Engineering & Materials Science

• Dark currents 100%
• Charged particles 95%
• Imaging techniques 50%
• Pixels 49%
• Sensors 34%
• Hot carriers 22%
• Leakage currents 17%
• Transistors 14%
• Electrodes 12%
• Temperature 6%

Physics & Astronomy

• dark current 68%
• CMOS 59%
• charged particles 56%
• pixels 53%
• sensors 40%
• readout 30%
• leakage 13%
• transistors 13%
• intervals 12%
• electrodes 10%

Chemical Compounds

• Leakage Current 87%
• Behavior as Electrode 33%