TY - GEN
T1 - A study on GaN inverter based MHz frequency induction heating for tiny metals
AU - Yamamoto, Naoki
AU - Hiraki, Eiji
AU - Tanaka, Toshihiko
AU - Yamada, Yukiharu
AU - Nagao, Tatsuya
AU - Miyake, Yasuhiro
AU - Noda, Yujiro
PY - 2013/12/1
Y1 - 2013/12/1
N2 - The anxiety of merging tiny materials and resin materials in the manufacturing process has become one of the serious issues because it may become cause of overheat such as lithium-ion batteries, flat panel displays, and so on. Therefore, a study on detecting method of the tiny metals is a significant issue. A combination of high-frequency induction heating and thermal detection method is one of the useful approaches. In this paper, MHz-frequency GaN inverter based IH system is built and tested to verify heating size limitation of the tiny metals. Furthermore, the validity of the proposed method to detect the tiny metals by proposed IH thermal technique is evaluated and discussed in detail.
AB - The anxiety of merging tiny materials and resin materials in the manufacturing process has become one of the serious issues because it may become cause of overheat such as lithium-ion batteries, flat panel displays, and so on. Therefore, a study on detecting method of the tiny metals is a significant issue. A combination of high-frequency induction heating and thermal detection method is one of the useful approaches. In this paper, MHz-frequency GaN inverter based IH system is built and tested to verify heating size limitation of the tiny metals. Furthermore, the validity of the proposed method to detect the tiny metals by proposed IH thermal technique is evaluated and discussed in detail.
KW - GaN
KW - high-frequency inverter
KW - induction heating
KW - tiny metal
UR - http://www.scopus.com/inward/record.url?scp=84893545546&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84893545546&partnerID=8YFLogxK
U2 - 10.1109/IECON.2013.6699949
DO - 10.1109/IECON.2013.6699949
M3 - Conference contribution
AN - SCOPUS:84893545546
SN - 9781479902248
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 5023
EP - 5027
BT - Proceedings, IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society
T2 - 39th Annual Conference of the IEEE Industrial Electronics Society, IECON 2013
Y2 - 10 November 2013 through 14 November 2013
ER -