Advantage of thin-film filter for reliable photoemission spectroscopy using high-flux discharging lamp

Takayoshi Yokoya; Shunsuke Tsuda; Takayuki Kiss; Shik Shin; Takashi Mochiku; Kazuto Hirata

Advantage of thin-film filter for reliable photoemission spectroscopy using high-flux discharging lamp

Takayoshi Yokoya, Shunsuke Tsuda, Takayuki Kiss, Shik Shin, Takashi Mochiku, Kazuto Hirata

Research output: Contribution to journal › Article › peer-review

Abstract

An aluminum film with a thickness of 1500Å has been used as a filter for the He Iα resonance line (21.2182eV) from a microwave-driven high-flux discharging lamp to reduce the degradation of sample surfaces during photoemission spectroscopy (PES) measurements. A marked increase in the lifetime of sample surfaces, which overcomes a ∼90% intensity reduction, has been observed. The thin-film filter, if combined with a high-flux discharging lamp, provides clean vacuum ultraviolet lights for reliable PES measurements with an ultrahigh resolution.

Original language	English
Pages (from-to)	3618-3619
Number of pages	2
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	43
Issue number	6 A
Publication status	Published - Jun 2004
Externally published	Yes

Keywords

Aluminum thin-film filter
Angle-resolved photoemission spectroscop
Degradation free
Discharging lamp

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Cite this

Advantage of thin-film filter for reliable photoemission spectroscopy using high-flux discharging lamp. / Yokoya, Takayoshi; Tsuda, Shunsuke; Kiss, Takayuki et al.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 43, No. 6 A, 06.2004, p. 3618-3619.

Research output: Contribution to journal › Article › peer-review

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abstract = "An aluminum film with a thickness of 1500{\AA} has been used as a filter for the He Iα resonance line (21.2182eV) from a microwave-driven high-flux discharging lamp to reduce the degradation of sample surfaces during photoemission spectroscopy (PES) measurements. A marked increase in the lifetime of sample surfaces, which overcomes a ∼90% intensity reduction, has been observed. The thin-film filter, if combined with a high-flux discharging lamp, provides clean vacuum ultraviolet lights for reliable PES measurements with an ultrahigh resolution.",

keywords = "Aluminum thin-film filter, Angle-resolved photoemission spectroscop, Degradation free, Discharging lamp",

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AU - Yokoya, Takayoshi

AU - Tsuda, Shunsuke

AU - Kiss, Takayuki

AU - Shin, Shik

AU - Mochiku, Takashi

AU - Hirata, Kazuto

PY - 2004/6

Y1 - 2004/6

N2 - An aluminum film with a thickness of 1500Å has been used as a filter for the He Iα resonance line (21.2182eV) from a microwave-driven high-flux discharging lamp to reduce the degradation of sample surfaces during photoemission spectroscopy (PES) measurements. A marked increase in the lifetime of sample surfaces, which overcomes a ∼90% intensity reduction, has been observed. The thin-film filter, if combined with a high-flux discharging lamp, provides clean vacuum ultraviolet lights for reliable PES measurements with an ultrahigh resolution.

AB - An aluminum film with a thickness of 1500Å has been used as a filter for the He Iα resonance line (21.2182eV) from a microwave-driven high-flux discharging lamp to reduce the degradation of sample surfaces during photoemission spectroscopy (PES) measurements. A marked increase in the lifetime of sample surfaces, which overcomes a ∼90% intensity reduction, has been observed. The thin-film filter, if combined with a high-flux discharging lamp, provides clean vacuum ultraviolet lights for reliable PES measurements with an ultrahigh resolution.

KW - Aluminum thin-film filter

KW - Angle-resolved photoemission spectroscop

KW - Degradation free

KW - Discharging lamp

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M3 - Article

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JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 6 A

ER -

Advantage of thin-film filter for reliable photoemission spectroscopy using high-flux discharging lamp

Abstract

Keywords

ASJC Scopus subject areas

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