Analysis of BGA defects by tomographic images

T. Sumimoto, Toshinori Maruyama, Yoshiharu Azuma, S. Goto, M. Mondou, N. Furukawa, S. Okada

Research output: Contribution to journalConference articlepeer-review


To improve the cost of performance in manufacturing IC packages, it is required to inspect BGA defects in the online process. The problems of image analysis for the detection of defects are the detection accuracy and image processing time according to a line speed of production. Using the X-ray penetration equipment, we have captured images of an IC package to search an abnormal BGA. To get design data for the development of the inspection system, which can be used easily in the surface mount process, we tried to capture the tomographic images utilizing the latest imaging techniques.


  • Ball grid array
  • Image analysis
  • Tomography
  • X-ray

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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