Abstract
This paper presents almost rigorous WienerHopf solutions to the plane wave scattering by a conducting finite thin plate. The final field expressions are given in an analytically compact form and the results are accurate as long as the plate width is greater than the wavelength. Numerical examples are given for the near and far field distributions. A criterion is also proposed to estimate under what condition the ray tracing method holds.
Original language | English |
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Pages (from-to) | 618-621 |
Number of pages | 4 |
Journal | IEICE Transactions on Electronics |
Volume | E81-C |
Issue number | 4 |
Publication status | Published - 1998 |
Externally published | Yes |
Keywords
- Near and far fields
- Ray tracing method
- Wiener-hopf technique
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering