Abstract
Anodically oxidized layers were grown on GaP (111) surfaces from a solution of N-methyl acetamide, H2O, NH4OH, and citric acid having a pH value of 9.0. The layer growth rate was 11 Å/V with a constant current density of 0.5 mA/cm2. Auger electron spectra and depth profiles of the components were measured. The phosphorous L3M 2,3M2,3 transition at 117 eV suffered a chemical shift in the oxide layers, and the shape of the first derivative of the Auger signal was completely different from that observed with P in GaP. Observation of the phosphorous K L2,3L2,3 transition at 1858 eV indicated that the ratio of P/Ga had a constant value throughout the oxide layers. Only the oxygen concentrations varied along with the depth.
Original language | English |
---|---|
Pages (from-to) | 447-449 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 33 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1978 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)