Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8

F. Z. Guo; T. Muro; T. Matsushita; T. Wakita; H. Ohashi; Y. Senba; T. Kinoshita; K. Kobayashi; Y. Saitoh; T. Koshikawa; T. Yasue; M. Oura; T. Takeuchi; S. Shin

doi:10.1063/1.2748387

Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8

F. Z. Guo, T. Muro, T. Matsushita, T. Wakita, H. Ohashi, Y. Senba, T. Kinoshita, K. Kobayashi, Y. Saitoh, T. Koshikawa, T. Yasue, M. Oura, T. Takeuchi, S. Shin

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Abstract

Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μ m2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.

Original language	English
Article number	066107
Journal	Review of Scientific Instruments
Volume	78
Issue number	6
DOIs	https://doi.org/10.1063/1.2748387
Publication status	Published - 2007
Externally published	Yes

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Instrumentation

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Guo, F. Z., Muro, T., Matsushita, T., Wakita, T., Ohashi, H., Senba, Y., Kinoshita, T., Kobayashi, K., Saitoh, Y., Koshikawa, T., Yasue, T., Oura, M., Takeuchi, T., & Shin, S. (2007). Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8. Review of Scientific Instruments, 78(6), Article 066107. https://doi.org/10.1063/1.2748387

Guo, FZ, Muro, T, Matsushita, T, Wakita, T, Ohashi, H, Senba, Y, Kinoshita, T, Kobayashi, K, Saitoh, Y, Koshikawa, T, Yasue, T, Oura, M, Takeuchi, T & Shin, S 2007, 'Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8', Review of Scientific Instruments, vol. 78, no. 6, 066107. https://doi.org/10.1063/1.2748387

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title = "Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8",

abstract = "Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μ m2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.",

author = "Guo, {F. Z.} and T. Muro and T. Matsushita and T. Wakita and H. Ohashi and Y. Senba and T. Kinoshita and K. Kobayashi and Y. Saitoh and T. Koshikawa and T. Yasue and M. Oura and T. Takeuchi and S. Shin",

note = "Funding Information: The authors are thankful to the staff of the soft x-ray beamlines at SPring-8. This work was performed at SPring-8 with the approval of the Japan Synchrotron Radiation Research Institute (Proposal Nos. 2005B0246 and 2006A1174) and was supported by a Nanotechnology Support Project of MEXT.",

year = "2007",

doi = "10.1063/1.2748387",

language = "English",

volume = "78",

journal = "Review of Scientific Instruments",

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T1 - Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8

AU - Guo, F. Z.

AU - Muro, T.

AU - Matsushita, T.

AU - Wakita, T.

AU - Ohashi, H.

AU - Senba, Y.

AU - Kinoshita, T.

AU - Kobayashi, K.

AU - Saitoh, Y.

AU - Koshikawa, T.

AU - Yasue, T.

AU - Oura, M.

AU - Takeuchi, T.

AU - Shin, S.

N1 - Funding Information: The authors are thankful to the staff of the soft x-ray beamlines at SPring-8. This work was performed at SPring-8 with the approval of the Japan Synchrotron Radiation Research Institute (Proposal Nos. 2005B0246 and 2006A1174) and was supported by a Nanotechnology Support Project of MEXT.

PY - 2007

Y1 - 2007

N2 - Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μ m2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.

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Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8

Abstract

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