| Original language | English |
|---|---|
| Pages (from-to) | 70-76 |
| Number of pages | 7 |
| Journal | IEEE Trans. Electron Devices |
| Volume | 50 |
| Publication status | Published - 2003 |
Dark current reduction in stacked-type CMOS-APS for charged particle imaging
Research output: Contribution to journal › Article
22
Citations
(Scopus)