De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements

Kazuki Maeda; Kengo Iokibe; Yoshitaka Toyota; Ryuji Koga

doi:10.1109/CEEM.2009.5303985

De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements

Kazuki Maeda, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009
Pages	246-249
Number of pages	4
DOIs	https://doi.org/10.1109/CEEM.2009.5303985
Publication status	Published - Dec 1 2009
Event	Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009 - Xi'an, China Duration: Sept 16 2009 → Sept 20 2009

Publication series

Name	Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009

Other

Other	Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009
Country/Territory	China
City	Xi'an
Period	9/16/09 → 9/20/09

ASJC Scopus subject areas

Computer Networks and Communications
Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/CEEM.2009.5303985

Cite this

Maeda, K., Iokibe, K., Toyota, Y., & Koga, R. (2009). De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. In Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009 (pp. 246-249). [5303985] (Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009). https://doi.org/10.1109/CEEM.2009.5303985

De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. / Maeda, Kazuki; Iokibe, Kengo ; Toyota, Yoshitaka et al.
Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009. 2009. p. 246-249 5303985 (Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Maeda, K, Iokibe, K , Toyota, Y & Koga, R 2009, De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. in Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009., 5303985, Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009, pp. 246-249, Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009, Xi'an, China, 9/16/09. https://doi.org/10.1109/CEEM.2009.5303985

Maeda K, Iokibe K , Toyota Y, Koga R. De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. In Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009. 2009. p. 246-249. 5303985. (Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009). doi: 10.1109/CEEM.2009.5303985

Maeda, Kazuki ; Iokibe, Kengo ; Toyota, Yoshitaka et al. / De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009. 2009. pp. 246-249 (Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009).

@inproceedings{52ddb306594541dd934e56bc4fbc8c23,

title = "De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements",

author = "Kazuki Maeda and Kengo Iokibe and Yoshitaka Toyota and Ryuji Koga",

year = "2009",

month = dec,

day = "1",

doi = "10.1109/CEEM.2009.5303985",

language = "English",

isbn = "9781424443444",

series = "Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009",

pages = "246--249",

booktitle = "Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009",

note = "Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009 ; Conference date: 16-09-2009 Through 20-09-2009",

}

TY - GEN

T1 - De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements

AU - Maeda, Kazuki

AU - Iokibe, Kengo

AU - Toyota, Yoshitaka

AU - Koga, Ryuji

PY - 2009/12/1

Y1 - 2009/12/1

UR - http://www.scopus.com/inward/record.url?scp=73549103371&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=73549103371&partnerID=8YFLogxK

U2 - 10.1109/CEEM.2009.5303985

DO - 10.1109/CEEM.2009.5303985

M3 - Conference contribution

AN - SCOPUS:73549103371

SN - 9781424443444

T3 - Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009

SP - 246

EP - 249

BT - Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009

T2 - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009

Y2 - 16 September 2009 through 20 September 2009

ER -

De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements

Publication series

Other

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this