TY - GEN
T1 - Density-functional analysis on vacancy orbital and its elastic response of silicon
AU - Ogawa, Takafumi
AU - Tsuruta, Kenji
AU - Iyetomi, Hiroshi
AU - Kaneta, Hiroshi Y.
AU - Goto, Terutaka
PY - 2010/11/5
Y1 - 2010/11/5
N2 - Recent experiments on ultrasonic measurements of non-doped and boron-doped silicon indicate that vacancies in crystalline silicon can be detected through the elastic softening at low temperature. This is attributed to enhanced response of electronic quadrupole localized at the vacancies to the elastic strain. In the present work, the electronic quadrupole moment of the vacancy orbital in silicon and their strain susceptibility are evaluated quantitatively by using the density-functional method. We show the orbital of gap state is localized around vacancy but extended over several neighbors. The effect of applied magnetic field on the vacancy orbital and its multipole structures are also investigated. We find that the results obtained from these calculations are consistent with the ultrasonic experiments.
AB - Recent experiments on ultrasonic measurements of non-doped and boron-doped silicon indicate that vacancies in crystalline silicon can be detected through the elastic softening at low temperature. This is attributed to enhanced response of electronic quadrupole localized at the vacancies to the elastic strain. In the present work, the electronic quadrupole moment of the vacancy orbital in silicon and their strain susceptibility are evaluated quantitatively by using the density-functional method. We show the orbital of gap state is localized around vacancy but extended over several neighbors. The effect of applied magnetic field on the vacancy orbital and its multipole structures are also investigated. We find that the results obtained from these calculations are consistent with the ultrasonic experiments.
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M3 - Conference contribution
AN - SCOPUS:78049322855
SN - 9781605111681
T3 - Materials Research Society Symposium Proceedings
SP - 213
EP - 218
BT - Reliability and Materials Issues of Semiconductor Optical and Electrical Devices and Materials
T2 - 2009 MRS Fall Meeting
Y2 - 30 November 2009 through 4 December 2009
ER -