Detection of CMOS open node defects by frequency analysis

Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo

doi:10.1093/ietisy/e90-d.3.685

Detection of CMOS open node defects by frequency analysis

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Research output: Contribution to journal › Article › peer-review

Abstract

A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).

Original language	English
Pages (from-to)	685-687
Number of pages	3
Journal	IEICE Transactions on Information and Systems
Volume	E90-D
Issue number	3
DOIs	https://doi.org/10.1093/ietisy/e90-d.3.685
Publication status	Published - Mar 2007

Keywords

Current test
Floating gate defect
Frequency analysis
Open node defect

ASJC Scopus subject areas

Software
Hardware and Architecture
Computer Vision and Pattern Recognition
Electrical and Electronic Engineering
Artificial Intelligence

Access to Document

10.1093/ietisy/e90-d.3.685

Cite this

@article{4f6056050e954c228483828e8f9b1a1a,

title = "Detection of CMOS open node defects by frequency analysis",

abstract = "A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).",

keywords = "Current test, Floating gate defect, Frequency analysis, Open node defect",

author = "Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Toshifumi Kobayashi and Tsutomu Hondo",

year = "2007",

month = mar,

doi = "10.1093/ietisy/e90-d.3.685",

language = "English",

volume = "E90-D",

pages = "685--687",

journal = "IEICE Transactions on Information and Systems",

issn = "0916-8532",

publisher = "Maruzen Co., Ltd/Maruzen Kabushikikaisha",

number = "3",

}

TY - JOUR

T1 - Detection of CMOS open node defects by frequency analysis

AU - Michinishi, Hiroyuki

AU - Yokohira, Tokumi

AU - Okamoto, Takuji

AU - Kobayashi, Toshifumi

AU - Hondo, Tsutomu

PY - 2007/3

Y1 - 2007/3

N2 - A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).

AB - A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).

KW - Current test

KW - Floating gate defect

KW - Frequency analysis

KW - Open node defect

UR - http://www.scopus.com/inward/record.url?scp=33947097428&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33947097428&partnerID=8YFLogxK

U2 - 10.1093/ietisy/e90-d.3.685

DO - 10.1093/ietisy/e90-d.3.685

M3 - Article

AN - SCOPUS:33947097428

SN - 0916-8532

VL - E90-D

SP - 685

EP - 687

JO - IEICE Transactions on Information and Systems

JF - IEICE Transactions on Information and Systems

IS - 3

ER -

Detection of CMOS open node defects by frequency analysis

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this