TY - GEN
T1 - Development of on-machine non-contact type aspherical measurement system
AU - Suzuki, H.
AU - Kinoshita, T.
AU - Onishi, T.
AU - Moriwaki, T.
AU - Miura, K.
AU - Okino, T.
PY - 2008/1/1
Y1 - 2008/1/1
N2 - A new non-contact type of on-machine measurement system with a laser probe has been developed. Subsequently, the laser probe with a B-axis rotary table was proposed to precisely measure an aspherical form with a large sweep angle. In this proposed method, the measurement probe is scanned to keep a normal angle to each measured point with different sweep angle. A trace of the measurement probe was calculated and the measurement accuracy was evaluated using a standard ball.
AB - A new non-contact type of on-machine measurement system with a laser probe has been developed. Subsequently, the laser probe with a B-axis rotary table was proposed to precisely measure an aspherical form with a large sweep angle. In this proposed method, the measurement probe is scanned to keep a normal angle to each measured point with different sweep angle. A trace of the measurement probe was calculated and the measurement accuracy was evaluated using a standard ball.
UR - http://www.scopus.com/inward/record.url?scp=84908233545&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84908233545&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84908233545
T3 - Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
SP - 325
EP - 328
BT - Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
A2 - Van Brussel, Hendrik
A2 - Brinksmeier, E.
A2 - Spaan, H.
A2 - Burke, T.
PB - euspen
T2 - 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
Y2 - 18 May 2008 through 22 May 2008
ER -