Direct observation of the field-stimulated exoemission sites at tungsten surfaces using field ion microscopy

T. Shiota, M. Umeno, K. Dohkuni, M. Tagawa, N. Ohmae

Research output: Contribution to journalArticlepeer-review

Abstract

The spatial distribution of the field-stimulated exoemission (FSEE) from the W tip surface annealed at 800 K for 600 s and the atomic arrangement of the emitting surface were correlated using field ion microscopy (FIM) and field emission microscopy. The FSEE was observed at around the (111) plane of the annealed W tip surface. FIM observation of the annealed W tip revealed the existence of a pyramid-like protrusion at the W(111) surface. From these experimental results, a new emission model of the FSEE was proposed relating to the field-assisted surface structural change. This model deals with the buildup/collapse of the pyramid-like protrusion at the W(111) surface under the effect of negative high electric field. The temperature dependence of the FSEE reported previously [Shiota et al., J. Appl. Phys. 85, 6811 (1999)] was qualitatively explained by this emission model.

Original languageEnglish
Pages (from-to)5177-5182
Number of pages6
JournalJournal of Applied Physics
Volume89
Issue number9
DOIs
Publication statusPublished - May 1 2001
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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