TY - JOUR
T1 - Effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser
AU - Shimose, Takahiro
AU - Okamoto, Yasuhiro
AU - Oshita, Masafumi
AU - Nishi, Norio
AU - Shinonaga, Togo
AU - Okada, Akira
N1 - Publisher Copyright:
© 2018 The Japan Society of Mechanical Engineers.
PY - 2018
Y1 - 2018
N2 - Silver nanowire transparent conductive film is expected as a new material of transparent electrode, because of its superior flexibility and electrical conductivity with transparency at visible wavelength. It is essential to form insulation areas on the silver nanowire transparent conductive film in electronic circuit. Laser beam processing has been widely used for this application, since high efficiency and high quality removal is possible without mechanical contact. On the other hand, laser beam is an electromagnetic wave, and it has unique characteristics such as refraction and polarization. These characteristics have a great influence on laser-material interaction, especially in nanosize materials. However, laser processing characteristics and its mechanism have not yet been clarified. Therefore, polarization indicated by electric and magnetic fields was discussed in this study, and effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser with linear polarization were experimentally and numerically investigated. Removal phenomena of silver nanowire transparent conductive film by linear polarization was different from that by circular polarization. Silver nanowires arranged in the parallel direction to polarization plane were preferentially removed. In the case of crossed two silver nanowires, electromagnetic field analysis revealed that electric field intensity of silver nanowire arranged in parallel direction to polarization plane is higher than that in perpendicular direction to polarization. Therefore, silver nanowires were selectively removed depending on the polarization plane of laser beam. Electric field intensities of silver nanowire arranged in not only parallel but also perpendicular direction to polarization plane were enhanced at intersection of silver nanowires, and holes as removal marks become remarkably large at intersections of silver nanowires.
AB - Silver nanowire transparent conductive film is expected as a new material of transparent electrode, because of its superior flexibility and electrical conductivity with transparency at visible wavelength. It is essential to form insulation areas on the silver nanowire transparent conductive film in electronic circuit. Laser beam processing has been widely used for this application, since high efficiency and high quality removal is possible without mechanical contact. On the other hand, laser beam is an electromagnetic wave, and it has unique characteristics such as refraction and polarization. These characteristics have a great influence on laser-material interaction, especially in nanosize materials. However, laser processing characteristics and its mechanism have not yet been clarified. Therefore, polarization indicated by electric and magnetic fields was discussed in this study, and effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser with linear polarization were experimentally and numerically investigated. Removal phenomena of silver nanowire transparent conductive film by linear polarization was different from that by circular polarization. Silver nanowires arranged in the parallel direction to polarization plane were preferentially removed. In the case of crossed two silver nanowires, electromagnetic field analysis revealed that electric field intensity of silver nanowire arranged in parallel direction to polarization plane is higher than that in perpendicular direction to polarization. Therefore, silver nanowires were selectively removed depending on the polarization plane of laser beam. Electric field intensities of silver nanowire arranged in not only parallel but also perpendicular direction to polarization plane were enhanced at intersection of silver nanowires, and holes as removal marks become remarkably large at intersections of silver nanowires.
KW - Electric field analysis
KW - Polarization
KW - Removal
KW - Silver nanowire
KW - Transparent conductive film
KW - Ultrashort pulsed laser
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U2 - 10.1299/jamdsm.2018jamdsm0100
DO - 10.1299/jamdsm.2018jamdsm0100
M3 - Article
AN - SCOPUS:85055844250
SN - 1881-3054
VL - 12
JO - Journal of Advanced Mechanical Design, Systems and Manufacturing
JF - Journal of Advanced Mechanical Design, Systems and Manufacturing
IS - 5
M1 - JAMDSM0100
ER -