Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8

S. Sakita; T. Suzuki; F. Nakamura; M. Nohara; Y. Maeno; T. Fujita

doi:10.1016/0921-4526(95)00700-8

Elastic softening in single-crystalline La_{2 - X}Sr_xCuO₄ around x = 1/8

S. Sakita, T. Suzuki, F. Nakamura, M. Nohara, Y. Maeno, T. Fujita

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

Ultrasound measurements have revealed a remarkable lattice softening of the transverse elastic modulus (C₁₁ - C₁₂)/2 in single-crystalline La_{2 - x}Sr_xCuO₄ only around x = 1/8. Analysis of the temperature dependence of the elastic modulus indicates that in the particular range of carrier concentration there exists a narrow electronic band in the vicinity of the Fermi level which couples to the shearing strain ε_xx - ε_yy.

Original language	English
Pages (from-to)	216-218
Number of pages	3
Journal	Physica B: Condensed Matter
Volume	219-220
Issue number	1-4
DOIs	https://doi.org/10.1016/0921-4526(95)00700-8
Publication status	Published - Apr 1 1996
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1016/0921-4526(95)00700-8

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title = "Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8",

abstract = "Ultrasound measurements have revealed a remarkable lattice softening of the transverse elastic modulus (C11 - C12)/2 in single-crystalline La2 - xSrxCuO4 only around x = 1/8. Analysis of the temperature dependence of the elastic modulus indicates that in the particular range of carrier concentration there exists a narrow electronic band in the vicinity of the Fermi level which couples to the shearing strain εxx - εyy.",

author = "S. Sakita and T. Suzuki and F. Nakamura and M. Nohara and Y. Maeno and T. Fujita",

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T1 - Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8

AU - Sakita, S.

AU - Suzuki, T.

AU - Nakamura, F.

AU - Nohara, M.

AU - Maeno, Y.

AU - Fujita, T.

PY - 1996/4/1

Y1 - 1996/4/1

N2 - Ultrasound measurements have revealed a remarkable lattice softening of the transverse elastic modulus (C11 - C12)/2 in single-crystalline La2 - xSrxCuO4 only around x = 1/8. Analysis of the temperature dependence of the elastic modulus indicates that in the particular range of carrier concentration there exists a narrow electronic band in the vicinity of the Fermi level which couples to the shearing strain εxx - εyy.

AB - Ultrasound measurements have revealed a remarkable lattice softening of the transverse elastic modulus (C11 - C12)/2 in single-crystalline La2 - xSrxCuO4 only around x = 1/8. Analysis of the temperature dependence of the elastic modulus indicates that in the particular range of carrier concentration there exists a narrow electronic band in the vicinity of the Fermi level which couples to the shearing strain εxx - εyy.

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ER -

Elastic softening in single-crystalline La_{2 - X}Sr_xCuO₄ around x = 1/8

Abstract

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