Erratum: Electronic structure and superconducting gap of silicon clathrate Ba8Si46 studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504))

T. Yokoya; A. Fukushima; T. Kiss; K. Kobayashi; S. Shin; K. Moriguchi; A. Shintani; H. Fukuoka; S. Yamanaka

doi:10.1103/PhysRevB.70.159902

Erratum: Electronic structure and superconducting gap of silicon clathrate Ba₈Si₄₆ studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504))

T. Yokoya, A. Fukushima, T. Kiss, K. Kobayashi, S. Shin, K. Moriguchi, A. Shintani, H. Fukuoka, S. Yamanaka

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Article number	159902
Pages (from-to)	159902-159901
Number of pages	2
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	70
Issue number	15
DOIs	https://doi.org/10.1103/PhysRevB.70.159902
Publication status	Published - Oct 2004
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.70.159902

Cite this

Yokoya, T., Fukushima, A., Kiss, T., Kobayashi, K., Shin, S., Moriguchi, K., Shintani, A., Fukuoka, H., & Yamanaka, S. (2004). Erratum: Electronic structure and superconducting gap of silicon clathrate Ba₈Si₄₆ studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504)). Physical Review B - Condensed Matter and Materials Physics, 70(15), 159902-159901. [159902]. https://doi.org/10.1103/PhysRevB.70.159902

Erratum: Electronic structure and superconducting gap of silicon clathrate Ba₈Si₄₆ studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504)). / Yokoya, T.; Fukushima, A.; Kiss, T. et al.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 70, No. 15, 159902, 10.2004, p. 159902-159901.

Research output: Contribution to journal › Comment/debate › peer-review

Yokoya, T, Fukushima, A, Kiss, T, Kobayashi, K, Shin, S, Moriguchi, K, Shintani, A, Fukuoka, H & Yamanaka, S 2004, 'Erratum: Electronic structure and superconducting gap of silicon clathrate Ba₈Si₄₆ studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504))', Physical Review B - Condensed Matter and Materials Physics, vol. 70, no. 15, 159902, pp. 159902-159901. https://doi.org/10.1103/PhysRevB.70.159902

Yokoya T, Fukushima A, Kiss T, Kobayashi K, Shin S, Moriguchi K et al. Erratum: Electronic structure and superconducting gap of silicon clathrate Ba₈Si₄₆ studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504)). Physical Review B - Condensed Matter and Materials Physics. 2004 Oct;70(15):159902-159901. 159902. doi: 10.1103/PhysRevB.70.159902

Yokoya, T. ; Fukushima, A. ; Kiss, T. et al. / Erratum : Electronic structure and superconducting gap of silicon clathrate Ba₈Si₄₆ studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504)). In: Physical Review B - Condensed Matter and Materials Physics. 2004 ; Vol. 70, No. 15. pp. 159902-159901.

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Erratum: Electronic structure and superconducting gap of silicon clathrate Ba8Si46 studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504))

ASJC Scopus subject areas

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Erratum: Electronic structure and superconducting gap of silicon clathrate Ba₈Si₄₆ studied with ultrahigh-resolution photoemission spectroscopy (Physical Review B - Condensed Matter and Materials Physics (2001) 64 (172504))