EXAFS studies under high pressure by X-ray Raman scattering

N. Hiraoka, H. Fukui, Takuo Okuchi

    Research output: Contribution to journalArticlepeer-review

    13 Citations (Scopus)


    We discuss extended X-ray absorption fine structure (EXAFS) measurements on light element compounds under high pressure. An absorption edge in light elements, ≤2 keV in energy, is measured by X-ray Raman scattering using 20 keV X-rays. To enhance the intensity, a large-culet, sintered polycrystalline diamond anvil cell is used, so that a scattering volume is maximized. For a pressure monitor, diffraction lines from NaCl powders compressed together with the sample are measured through an X-ray Raman spectrometer. With this set-up, we have measured EXAFS features at the oxygen K-edge in (Formula presented.) glass up to 30 GPa. As the pressure increases, the oscillation pattern drastically changes, associated with the densification of the glass.

    Original languageEnglish
    Pages (from-to)1-12
    Number of pages12
    JournalHigh Pressure Research
    Publication statusAccepted/In press - Jul 15 2016


    • EXAFS
    • high pressure
    • X-ray Raman scattering

    ASJC Scopus subject areas

    • Condensed Matter Physics


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