Examining the linear complexity of multi-value sequence generated by power residue symbol

Hiroto Ino; Yasuyuki Nogami; Nasima Begum; Satoshi Uehara; Robert Morelos-Zaragoza; Kazuyoshi Tsuchiya

doi:10.1109/ICISSEC.2015.7371002

Examining the linear complexity of multi-value sequence generated by power residue symbol

Hiroto Ino, Yasuyuki Nogami, Nasima Begum, Satoshi Uehara, Robert Morelos-Zaragoza, Kazuyoshi Tsuchiya

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

In our previous work, k-value pseudo random sequence generated by power residue symbol has been researched. The sequence is generated by applying a primitive polynomial over odd characteristics field, trace function, and power residue symbol. The sequence has some important features such as period, periodic autocorrelation, and linear complexity. In this paper, by applying an additional process to the previous procedure, an extended multi-value sequence is generated. Its features, such as the period, periodic autocorrelation, periodic crosscorrelation, and linear complexity are examined in this paper. According to the results, the new sequence also has some interesting features.

Original language	English
Title of host publication	2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781467386111
DOIs	https://doi.org/10.1109/ICISSEC.2015.7371002
Publication status	Published - Jan 4 2016
Event	2nd IEEE International Conference on Information Science and Security, ICISS 2015 - Seoul, Korea, Republic of Duration: Dec 14 2015 → Dec 16 2015

Publication series

Name	2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015

Other

Other	2nd IEEE International Conference on Information Science and Security, ICISS 2015
Country/Territory	Korea, Republic of
City	Seoul
Period	12/14/15 → 12/16/15

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Computer Networks and Communications
Information Systems

Access to Document

10.1109/ICISSEC.2015.7371002

Cite this

Ino, H., Nogami, Y., Begum, N., Uehara, S., Morelos-Zaragoza, R., & Tsuchiya, K. (2016). Examining the linear complexity of multi-value sequence generated by power residue symbol. In 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015 [7371002] (2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICISSEC.2015.7371002

Examining the linear complexity of multi-value sequence generated by power residue symbol. / Ino, Hiroto; Nogami, Yasuyuki; Begum, Nasima et al.
2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015. Institute of Electrical and Electronics Engineers Inc., 2016. 7371002 (2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ino, H, Nogami, Y, Begum, N, Uehara, S, Morelos-Zaragoza, R & Tsuchiya, K 2016, Examining the linear complexity of multi-value sequence generated by power residue symbol. in 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015., 7371002, 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015, Institute of Electrical and Electronics Engineers Inc., 2nd IEEE International Conference on Information Science and Security, ICISS 2015, Seoul, Korea, Republic of, 12/14/15. https://doi.org/10.1109/ICISSEC.2015.7371002

Ino H, Nogami Y, Begum N, Uehara S, Morelos-Zaragoza R, Tsuchiya K. Examining the linear complexity of multi-value sequence generated by power residue symbol. In 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015. Institute of Electrical and Electronics Engineers Inc. 2016. 7371002. (2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015). doi: 10.1109/ICISSEC.2015.7371002

Ino, Hiroto ; Nogami, Yasuyuki ; Begum, Nasima et al. / Examining the linear complexity of multi-value sequence generated by power residue symbol. 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015. Institute of Electrical and Electronics Engineers Inc., 2016. (2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015).

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abstract = "In our previous work, k-value pseudo random sequence generated by power residue symbol has been researched. The sequence is generated by applying a primitive polynomial over odd characteristics field, trace function, and power residue symbol. The sequence has some important features such as period, periodic autocorrelation, and linear complexity. In this paper, by applying an additional process to the previous procedure, an extended multi-value sequence is generated. Its features, such as the period, periodic autocorrelation, periodic crosscorrelation, and linear complexity are examined in this paper. According to the results, the new sequence also has some interesting features.",

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AU - Tsuchiya, Kazuyoshi

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AB - In our previous work, k-value pseudo random sequence generated by power residue symbol has been researched. The sequence is generated by applying a primitive polynomial over odd characteristics field, trace function, and power residue symbol. The sequence has some important features such as period, periodic autocorrelation, and linear complexity. In this paper, by applying an additional process to the previous procedure, an extended multi-value sequence is generated. Its features, such as the period, periodic autocorrelation, periodic crosscorrelation, and linear complexity are examined in this paper. According to the results, the new sequence also has some interesting features.

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Examining the linear complexity of multi-value sequence generated by power residue symbol

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