Excellent fault tolerance of a MEMS optically differential reconfigurable gate array

Hironobu Morita; Minoru Watanabe

doi:10.1109/OMEMS.2010.5672149

Excellent fault tolerance of a MEMS optically differential reconfigurable gate array

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

(Figure Presented) This paper presents a four-context MEMS optically differential reconfigurable gate array that is useful in a space radiation environment. The technique enables rapid recovery of a programmable device that has been damaged by high-energy charged particles. It can use incorrect configuration data including some error bits resulting from damage by particles. This paper also clarifies the fault tolerance of the MEMS optically differential reconfigurable gate array.

Original language	English
Title of host publication	2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010
Pages	133-134
Number of pages	2
DOIs	https://doi.org/10.1109/OMEMS.2010.5672149
Publication status	Published - 2010
Externally published	Yes
Event	2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010 - Sapporo, Japan Duration: Aug 9 2010 → Aug 12 2010

Publication series

Name	2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010

Conference

Conference	2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010
Country/Territory	Japan
City	Sapporo
Period	8/9/10 → 8/12/10

ASJC Scopus subject areas

Control and Systems Engineering
Electrical and Electronic Engineering

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10.1109/OMEMS.2010.5672149

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Morita, H., & Watanabe, M. (2010). Excellent fault tolerance of a MEMS optically differential reconfigurable gate array. In 2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010 (pp. 133-134). Article 5672149 (2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010). https://doi.org/10.1109/OMEMS.2010.5672149

Excellent fault tolerance of a MEMS optically differential reconfigurable gate array. / Morita, Hironobu; Watanabe, Minoru.
2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010. 2010. p. 133-134 5672149 (2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Morita, H & Watanabe, M 2010, Excellent fault tolerance of a MEMS optically differential reconfigurable gate array. in 2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010., 5672149, 2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010, pp. 133-134, 2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010, Sapporo, Japan, 8/9/10. https://doi.org/10.1109/OMEMS.2010.5672149

Morita H, Watanabe M. Excellent fault tolerance of a MEMS optically differential reconfigurable gate array. In 2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010. 2010. p. 133-134. 5672149. (2010 International Conference on Optical MEMS and Nanophotonics, Optical MEMS and Nanophotonics 2010). doi: 10.1109/OMEMS.2010.5672149

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Excellent fault tolerance of a MEMS optically differential reconfigurable gate array

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