Fabrications of Pb(Sc1/2Nb1/2)O 3/xPbTiO3 thin films and their structural characterizations

Shutaro Asanuma, Mamoru Fukunaga, Yoshiaki Uesu, Raphael Haumont, Brahim Dkhil, Charlotte Malibert, Jean Michel Kiat

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


Highly oriented Pb(Sc1/2Nb1/2)O3 (PSN) and Pb(Sc1/2Nb1/2)O3/43%PbTiO3 (PSN/43%PT) thin films were fabricated on MgO and SrTiO3 (001) substrates by pulsed laser deposition (PLD) technique. La1/2Sr 1/2CoO3 was deposited on the substrate as a bottom electrode layer for dielectric measurements. The orientation of the films was checked by X-ray diffraction method, and is found to be well oriented along the c-axis for PSN and PSN/PT. Film thickness was determined by the Laue oscillation of X-ray diffraction profile. This enables us to determine the number of pulses for stacking one layer of PSN and PSN/PT thin films. The temperature dependences of lattice constants of PSN and PSN/PT thin films were determined. They exhibit small but clear changes at almost the same temperature as that of the ferroelectric transition points of PSN and PSN/PT ceramics. The surface roughness of these films was observed using atomic force and scanning electron microscopes. Temperature change of dielectric constant e and D-E hysteresis loop were determined for PSN and the real part of e shows 850.

Original languageEnglish
Pages (from-to)6581-6584
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number9 B
Publication statusPublished - Sept 2004


  • Dielectric constant
  • Pb(Sc Nb)O/43%PbTiO
  • Pb(ScNb)O
  • Pulsed laser deposition
  • Relaxor
  • Thin film

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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