TY - GEN
T1 - FPGA Switching Current Modeling Based on Register Transfer Level Logic Simulation for Power Side-channel Attack Prediction
AU - Himuro, Masaki
AU - Iokibe, Kengo
AU - Toyota, Yoshitaka
N1 - Funding Information:
This work was supported by JSPS KAKENHI Grant Number JP19H04110.
Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - We investigated the prediction of side-channel leak-age on the power delivery network (PDN) outside a cryptographic IC. To predict the leakage, it is necessary to estimate the switching current caused by the switching activity. So far, high temporal resolution estimation based on gate-level logic simulation has been proposed, but due to the decoupling property of the PDN, the switching current leaking out of the IC chip attenuates signif-icantly. Therefore, this paper calculates the mean of the switching currents over the clock period based on register transfer level (RTL) logic simulation, and then approximates it into a triangle waveform. This approach enables us to simulate the switching current faster than with gate-level simulation. In addition, the simulation time is further shortened by calculating the switching current only to the targeted round of a cryptographic algorithm (AES). Switching currents of the previous rounds were given as statistical models with the same sample mean and variance as the targeted round. As a result of simulating the switching current of an FPGA with the proposed method, we were able to obtain the low-order harmonic components of the current in almost the same magnitude as the gate-level simulation. We also simulated correlation power analysis (CPA) results for the printed circuit board on which the FPGA with the AES circuit was mounted, and found that the proposed method could predict the dynamic power supply voltage observed on the board and CPA results with sufficient accuracy.
AB - We investigated the prediction of side-channel leak-age on the power delivery network (PDN) outside a cryptographic IC. To predict the leakage, it is necessary to estimate the switching current caused by the switching activity. So far, high temporal resolution estimation based on gate-level logic simulation has been proposed, but due to the decoupling property of the PDN, the switching current leaking out of the IC chip attenuates signif-icantly. Therefore, this paper calculates the mean of the switching currents over the clock period based on register transfer level (RTL) logic simulation, and then approximates it into a triangle waveform. This approach enables us to simulate the switching current faster than with gate-level simulation. In addition, the simulation time is further shortened by calculating the switching current only to the targeted round of a cryptographic algorithm (AES). Switching currents of the previous rounds were given as statistical models with the same sample mean and variance as the targeted round. As a result of simulating the switching current of an FPGA with the proposed method, we were able to obtain the low-order harmonic components of the current in almost the same magnitude as the gate-level simulation. We also simulated correlation power analysis (CPA) results for the printed circuit board on which the FPGA with the AES circuit was mounted, and found that the proposed method could predict the dynamic power supply voltage observed on the board and CPA results with sufficient accuracy.
KW - AES
KW - correlation power analysis
KW - FPGA
KW - prediction of information leakage
KW - register transfer level
KW - side-channel attack
UR - http://www.scopus.com/inward/record.url?scp=85140215867&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85140215867&partnerID=8YFLogxK
U2 - 10.1109/EMCEurope51680.2022.9900948
DO - 10.1109/EMCEurope51680.2022.9900948
M3 - Conference contribution
AN - SCOPUS:85140215867
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 172
EP - 177
BT - 2022 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2022
Y2 - 5 September 2022 through 8 September 2022
ER -