TY - GEN
T1 - Fusion Method of Convolutional Neural Network and Support Vector Machine for High Accuracy Anomaly Detection
AU - Nagata, Fusaomi
AU - Tokuno, Kenta
AU - Nakashima, Kento
AU - Otsuka, Akimasa
AU - Ikeda, Takeshi
AU - Ochi, Hiroyuki
AU - Watanabe, Keigo
AU - Habib, Maki K.
N1 - Funding Information:
ACKNOWLEDGMENT This work was supported by JSPS KAKENHI Grant Number 16K06203 and MITSUBISHIPENCIL CO., LTD.
Publisher Copyright:
© 2019 IEEE.
PY - 2019/8
Y1 - 2019/8
N2 - In this paper, binary classification methods using support vector machines (SVM) obtained from one-class learning and two-class learning are introduced. Firstly, an application of deep CNN (DCNN) for visual inspection is developed and is trained using a large number of images to inspect undesirable defects seen in resin molded articles. Then, the trained DCNN named sssNet and well-known Alexnet are respectively incorporated with two kinds of one-class learning based SVMs to classify sample images with high recognition rate into accept as OK category or reject as NG category, in which compressed feature vectors obtained from the DCNNs are used as the inputs for the SVMs. The performances of two SVMs obtained from one-class learning are compared and evaluated through training and classification experiments. Then, another SVM obtained from two-class learning is introduced. Finally, a template matching technique is further applied to extract important target areas from original training and test images. This will be able to enhance the reliability and accuracy for binary classification.
AB - In this paper, binary classification methods using support vector machines (SVM) obtained from one-class learning and two-class learning are introduced. Firstly, an application of deep CNN (DCNN) for visual inspection is developed and is trained using a large number of images to inspect undesirable defects seen in resin molded articles. Then, the trained DCNN named sssNet and well-known Alexnet are respectively incorporated with two kinds of one-class learning based SVMs to classify sample images with high recognition rate into accept as OK category or reject as NG category, in which compressed feature vectors obtained from the DCNNs are used as the inputs for the SVMs. The performances of two SVMs obtained from one-class learning are compared and evaluated through training and classification experiments. Then, another SVM obtained from two-class learning is introduced. Finally, a template matching technique is further applied to extract important target areas from original training and test images. This will be able to enhance the reliability and accuracy for binary classification.
KW - Deep Convolutional Neural Network (DCNN)
KW - Defect Inspection System
KW - Support Vector Machine (SVM)
UR - http://www.scopus.com/inward/record.url?scp=85072405511&partnerID=8YFLogxK
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U2 - 10.1109/ICMA.2019.8816454
DO - 10.1109/ICMA.2019.8816454
M3 - Conference contribution
AN - SCOPUS:85072405511
T3 - Proceedings of 2019 IEEE International Conference on Mechatronics and Automation, ICMA 2019
SP - 970
EP - 975
BT - Proceedings of 2019 IEEE International Conference on Mechatronics and Automation, ICMA 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th IEEE International Conference on Mechatronics and Automation, ICMA 2019
Y2 - 4 August 2019 through 7 August 2019
ER -