TY - GEN
T1 - HAZOP analysis system compliant with equipment models based on SDG
AU - Isshiki, Ken
AU - Munesawa, Yoshiomi
AU - Nakai, Atsuko
AU - Suzuki, Kazuhiko
PY - 2013/8/16
Y1 - 2013/8/16
N2 - It is important to assess the risk in chemical plants. HAZOP is widely used in the risk assessment to identify hazard. An automatic analysis system is developed to perform HAZOP effectively. In this study, semi-automatic analysis system was developed by using the Signed Directed Graph (SDG) as a deviation in the behavior of the propagation of equipment. Versatility of analysis is raised based on the propagation of deviation by adding the device in accordance with the rules. Our developed HAZOP analysis system is applied to one chemical process. And the future works for this study are explained.
AB - It is important to assess the risk in chemical plants. HAZOP is widely used in the risk assessment to identify hazard. An automatic analysis system is developed to perform HAZOP effectively. In this study, semi-automatic analysis system was developed by using the Signed Directed Graph (SDG) as a deviation in the behavior of the propagation of equipment. Versatility of analysis is raised based on the propagation of deviation by adding the device in accordance with the rules. Our developed HAZOP analysis system is applied to one chemical process. And the future works for this study are explained.
KW - HAZOP analysis
KW - Signed Directed Graph
KW - hazard identification
UR - http://www.scopus.com/inward/record.url?scp=84881390479&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84881390479&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-38577-3_47
DO - 10.1007/978-3-642-38577-3_47
M3 - Conference contribution
AN - SCOPUS:84881390479
SN - 9783642385766
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 460
EP - 469
BT - Recent Trends in Applied Artificial Intelligence - 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013, Proceedings
T2 - 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013
Y2 - 17 June 2013 through 21 June 2013
ER -