High precision isotope micro-imaging of materials

Hisayoshi Yurimoto, Kazuhide Nagashima, Takuya Kunihiro

Research output: Contribution to journalArticlepeer-review

77 Citations (Scopus)


Secondary ion mass spectrometry (SIMS) is widely used to identify the isotope ratio of the micro-area of materials. We demonstrate that the precision and spatial resolution of an ion microscope using SIMS coupled with a newly developed solid-state ion imager can be extended to two-dimensional isotope ratio imaging with permil-precision. An isotopic map for oxygen clearly reveals the distribution of 4% enrichment of 16 O in spinel particles embedded in melilite from a Ca-Al-rich inclusion of a carbonaceous chondrite. This characterization technique called isotopography thus provides the eyes to see small heterogeneity of isotope abundance in micro-scale. It is likely to find broad application in earth, material, and life science research.

Original languageEnglish
Pages (from-to)793-797
Number of pages5
JournalApplied Surface Science
Publication statusPublished - Jan 15 2003
Externally publishedYes


  • Imaging
  • Ion detector
  • Isotope
  • Meteorite
  • Oxygen
  • SIMS

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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