Recently, field programmable gate arrays (FPGAs) are anticipated for use in high-radiation environments such as that of the Fukushima Daiichi nuclear power plant. According to recently reported news, an area with 650 Sv/h radiation intensity has been confirmed outside of a containment vessel at the Fukushima Daiichi nuclear power plant. For uses under such extremely high radiation environments, high-speed scrubbing operations must be applied for FPGAs. A high-speed optical scrubbing method that can be used on optically reconfigurable gate arrays has been proposed in recent reports of the literature. Such optically reconfigurable gate arrays using optical high-speed scrubbing can be used in environments with intense radiation. In addition, to increase the optical scrubbing operation speed, this paper demonstrates a high-speed optical scrubbing method with a simpler sequence for use on an optically reconfigurable gate array. The 50 ns period high-speed scrubbing operation could be confirmed on the fabricated optically reconfigurable gate array VLSI.