Improvement of detectability for CMOS floating gate defects in supply current test

H. Michinishi; T. Yokohira; T. Okamoto; T. Kobayashi; T. Hondo

doi:10.1109/ATS.2003.1250846

Improvement of detectability for CMOS floating gate defects in supply current test

H. Michinishi, T. Yokohira, T. Okamoto, T. Kobayashi, T. Hondo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.

Original language	English
Title of host publication	Proceedings - 12th Asian Test Symposium, ATS 2003
Publisher	IEEE Computer Society
Pages	406-409
Number of pages	4
ISBN (Electronic)	0769519512
DOIs	https://doi.org/10.1109/ATS.2003.1250846
Publication status	Published - 2003
Event	12th Asian Test Symposium, ATS 2003 - Xi'an, China Duration: Nov 16 2003 → Nov 19 2003

Publication series

Name	Proceedings of the Asian Test Symposium
Volume	2003-January
ISSN (Print)	1081-7735

Other

Other	12th Asian Test Symposium, ATS 2003
Country/Territory	China
City	Xi'an
Period	11/16/03 → 11/19/03

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ATS.2003.1250846

Cite this

Improvement of detectability for CMOS floating gate defects in supply current test. / Michinishi, H.; Yokohira, T.; Okamoto, T. et al.
Proceedings - 12th Asian Test Symposium, ATS 2003. IEEE Computer Society, 2003. p. 406-409 1250846 (Proceedings of the Asian Test Symposium; Vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Michinishi, H, Yokohira, T, Okamoto, T, Kobayashi, T & Hondo, T 2003, Improvement of detectability for CMOS floating gate defects in supply current test. in Proceedings - 12th Asian Test Symposium, ATS 2003., 1250846, Proceedings of the Asian Test Symposium, vol. 2003-January, IEEE Computer Society, pp. 406-409, 12th Asian Test Symposium, ATS 2003, Xi'an, China, 11/16/03. https://doi.org/10.1109/ATS.2003.1250846

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abstract = "We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.",

author = "H. Michinishi and T. Yokohira and T. Okamoto and T. Kobayashi and T. Hondo",

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AU - Kobayashi, T.

AU - Hondo, T.

PY - 2003

Y1 - 2003

N2 - We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.

AB - We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.

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Improvement of detectability for CMOS floating gate defects in supply current test

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