TY - JOUR
T1 - In situ structural characterization of picene thin films by X-ray scattering
T2 - Vacuum versus O 2 atmosphere
AU - Hosokai, T.
AU - Hinderhofer, A.
AU - Vorobiev, A.
AU - Lorch, C.
AU - Watanabe, T.
AU - Koganezawa, T.
AU - Gerlach, A.
AU - Yoshimoto, N.
AU - Kubozono, Y.
AU - Schreiber, F.
N1 - Funding Information:
The authors thank I. Hirosawa (JASRI/SPring-8) and F. Bussolotti (Chiba University) for helpful discussions and the ESRF for experimental support. This work was financially supported partly by the DFG, the Alexander von Humboldt Foundation and Grant-in-Aid for Scientific Research, JSPS (1560005). The synchrotron radiation experiments at the BL19B2 of SPring-8 were performed with the approval of the Japan Synchrotron Radiation Research Institute (JASRI) (Proposal Nos. 2011AB0036 and 2011A1843).
PY - 2012/8/20
Y1 - 2012/8/20
N2 - Structure and morphology of picene films under vacuum and O 2 atmosphere were studied by in situ synchrotron X-ray scattering. We observed that picene films exhibit a highly oriented and ordered structure, which is similar to the one reported for picene single crystals. Furthermore, we found that the film structure determined under vacuum remains nearly unchanged under O 2 atmosphere. The results provide new insights into a high hole mobility and O 2 gas sensing mechanism previously reported for picene thin film-based organic field-effect transistors.
AB - Structure and morphology of picene films under vacuum and O 2 atmosphere were studied by in situ synchrotron X-ray scattering. We observed that picene films exhibit a highly oriented and ordered structure, which is similar to the one reported for picene single crystals. Furthermore, we found that the film structure determined under vacuum remains nearly unchanged under O 2 atmosphere. The results provide new insights into a high hole mobility and O 2 gas sensing mechanism previously reported for picene thin film-based organic field-effect transistors.
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U2 - 10.1016/j.cplett.2012.07.006
DO - 10.1016/j.cplett.2012.07.006
M3 - Article
AN - SCOPUS:84864684439
SN - 0009-2614
VL - 544
SP - 34
EP - 38
JO - Chemical Physics Letters
JF - Chemical Physics Letters
ER -