Microstructural properties of (112¯0)-oriented hematite-ilmenite solid solution films

Tatsuo Fujii; Tomohiro Mino; Shunsuke Kanamaru; Makoto Nakanishi; Hideki Hashimoto; Jun Takada

doi:10.1016/j.tsf.2015.04.028

Microstructural properties of (112¯0)-oriented hematite-ilmenite solid solution films

Tatsuo Fujii, Tomohiro Mino, Shunsuke Kanamaru, Makoto Nakanishi, Hideki Hashimoto, Jun Takada

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Ilmenite-hematite solid solution (Fe_2-xTi_xO₃) is one of the candidates for high-temperature magnetic semiconductors. Well-crystallized and epitaxially formed Fe_2-xTi_xO₃ films on α-Al₂O₃ (112¯0) single-crystalline substrates were tried to fabricate by using reactive sputtering technique. The detailed structural properties of (112¯0)-oriented epitaxial Fe_1.4Ti_0.6O₃ films were analyzed by using transmission electron microscope (TEM). The films showed large magnetization and typical semiconductive conduction at room temperature. However their anisotropic properties were rather small than expected, though the films had good crystallinity with preferred orientation. The TEM observations clearly revealed that the (112¯0)-oriented Fe_1.4Ti_0.6O₃ films on α-Al₂O₃(112¯0) were partly composed of the (0001)-oriented grains. Formation of the (0001)-oriented grains could reduce the anisotropic properties of the (112¯0)-oriented films.

Original language	English
Pages (from-to)	245-249
Number of pages	5
Journal	Thin Solid Films
Volume	591
DOIs	https://doi.org/10.1016/j.tsf.2015.04.028
Publication status	Published - Sept 30 2015

Keywords

Epitaxial film
High-resolution scanning transmission electron microscopy
Ilmenite-hematite solid solution
Magnetic and electric anisotropies

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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@article{e3cf10a5bcc74d90beb47b2e1826f4d0,

title = "Microstructural properties of (112¯0)-oriented hematite-ilmenite solid solution films",

abstract = "Ilmenite-hematite solid solution (Fe2-xTixO3) is one of the candidates for high-temperature magnetic semiconductors. Well-crystallized and epitaxially formed Fe2-xTixO3 films on α-Al2O3 (112¯0) single-crystalline substrates were tried to fabricate by using reactive sputtering technique. The detailed structural properties of (112¯0)-oriented epitaxial Fe1.4Ti0.6O3 films were analyzed by using transmission electron microscope (TEM). The films showed large magnetization and typical semiconductive conduction at room temperature. However their anisotropic properties were rather small than expected, though the films had good crystallinity with preferred orientation. The TEM observations clearly revealed that the (112¯0)-oriented Fe1.4Ti0.6O3 films on α-Al2O3(112¯0) were partly composed of the (0001)-oriented grains. Formation of the (0001)-oriented grains could reduce the anisotropic properties of the (112¯0)-oriented films.",

keywords = "Epitaxial film, High-resolution scanning transmission electron microscopy, Ilmenite-hematite solid solution, Magnetic and electric anisotropies",

author = "Tatsuo Fujii and Tomohiro Mino and Shunsuke Kanamaru and Makoto Nakanishi and Hideki Hashimoto and Jun Takada",

note = "Funding Information: This work was supported by JSPS KAKENHI Grant Number 23350092 . Publisher Copyright: {\textcopyright} 2015 Elsevier B.V.",

year = "2015",

month = sep,

day = "30",

doi = "10.1016/j.tsf.2015.04.028",

language = "English",

volume = "591",

pages = "245--249",

journal = "Thin Solid Films",

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TY - JOUR

T1 - Microstructural properties of (112¯0)-oriented hematite-ilmenite solid solution films

AU - Fujii, Tatsuo

AU - Mino, Tomohiro

AU - Kanamaru, Shunsuke

AU - Nakanishi, Makoto

AU - Hashimoto, Hideki

AU - Takada, Jun

PY - 2015/9/30

Y1 - 2015/9/30

N2 - Ilmenite-hematite solid solution (Fe2-xTixO3) is one of the candidates for high-temperature magnetic semiconductors. Well-crystallized and epitaxially formed Fe2-xTixO3 films on α-Al2O3 (112¯0) single-crystalline substrates were tried to fabricate by using reactive sputtering technique. The detailed structural properties of (112¯0)-oriented epitaxial Fe1.4Ti0.6O3 films were analyzed by using transmission electron microscope (TEM). The films showed large magnetization and typical semiconductive conduction at room temperature. However their anisotropic properties were rather small than expected, though the films had good crystallinity with preferred orientation. The TEM observations clearly revealed that the (112¯0)-oriented Fe1.4Ti0.6O3 films on α-Al2O3(112¯0) were partly composed of the (0001)-oriented grains. Formation of the (0001)-oriented grains could reduce the anisotropic properties of the (112¯0)-oriented films.

AB - Ilmenite-hematite solid solution (Fe2-xTixO3) is one of the candidates for high-temperature magnetic semiconductors. Well-crystallized and epitaxially formed Fe2-xTixO3 films on α-Al2O3 (112¯0) single-crystalline substrates were tried to fabricate by using reactive sputtering technique. The detailed structural properties of (112¯0)-oriented epitaxial Fe1.4Ti0.6O3 films were analyzed by using transmission electron microscope (TEM). The films showed large magnetization and typical semiconductive conduction at room temperature. However their anisotropic properties were rather small than expected, though the films had good crystallinity with preferred orientation. The TEM observations clearly revealed that the (112¯0)-oriented Fe1.4Ti0.6O3 films on α-Al2O3(112¯0) were partly composed of the (0001)-oriented grains. Formation of the (0001)-oriented grains could reduce the anisotropic properties of the (112¯0)-oriented films.

KW - Epitaxial film

KW - High-resolution scanning transmission electron microscopy

KW - Ilmenite-hematite solid solution

KW - Magnetic and electric anisotropies

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JO - Thin Solid Films

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Microstructural properties of (112¯0)-oriented hematite-ilmenite solid solution films

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Keywords

ASJC Scopus subject areas

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