Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Tokumi Yokohira; Toshimi Shimizu; Hiroyuki Michinishi; Yuji Sugiyama; Takuji Okamoto

Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2^w test patterns, where w is the maximum number of inputs on which any output depends.

Original language	English
Pages (from-to)	280-285
Number of pages	6
Journal	Proceedings of the Asian Test Symposium
Publication status	Published - 1994
Event	Proceedings of the 3rd Asian Test Symposium - Nara, Jpn Duration: Nov 15 1994 → Nov 17 1994

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@article{73d3c0a365cd4e0cb2c4ef0723d51a30,

title = "Minimum test sets for locally exhaustive testing of combinational circuits with five outputs",

abstract = "In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.",

author = "Tokumi Yokohira and Toshimi Shimizu and Hiroyuki Michinishi and Yuji Sugiyama and Takuji Okamoto",

year = "1994",

language = "English",

pages = "280--285",

journal = "Proceedings of the Asian Test Symposium",

issn = "1081-7735",

publisher = "IEEE Computer Society",

note = "Proceedings of the 3rd Asian Test Symposium ; Conference date: 15-11-1994 Through 17-11-1994",

}

TY - JOUR

T1 - Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

AU - Yokohira, Tokumi

AU - Shimizu, Toshimi

AU - Michinishi, Hiroyuki

AU - Sugiyama, Yuji

AU - Okamoto, Takuji

PY - 1994

Y1 - 1994

N2 - In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.

AB - In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.

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UR - http://www.scopus.com/inward/citedby.url?scp=0028727436&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0028727436

SN - 1081-7735

SP - 280

EP - 285

JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

T2 - Proceedings of the 3rd Asian Test Symposium

Y2 - 15 November 1994 through 17 November 1994

ER -

Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Abstract

ASJC Scopus subject areas

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