TY - GEN
T1 - Multi-context scrubbing method
AU - Fujimori, Takumi
AU - Watanabe, Minora
N1 - Funding Information:
This research was partly supported by the Ministry of Education, Science, Sports and Culture, Grant-in-Aid for JSPS Research Fellow, No. 16Jl2063 and Grant-in-Aid for Scientific Research(B), No. 15H02676. The VLSI chip in this study was fabricated in the chip fabrication program of VLSI Design and Education Center (VDEC), the University of Tokyo in collaboration with Rohm Co. Ltd. and Toppan Printing Co. Ltd.
Publisher Copyright:
© 2017 IEEE.
PY - 2017/9/27
Y1 - 2017/9/27
N2 - Two salient concerns of current field programmable gate arrays (FPGAs) used for space applications are how to block soft errors that arise on their configuration memories and how to treat permanent failures attributable to total dose effects. To date, those two main concerns have been treated separately, but we present a proposal for multi-context scrubbing to 'kill two birds with one stone' and resolve both issues simultaneously. To decrease the frequency of soft errors arising on the configuration memories of FPGAs, applying scrubbing operations for configuration memories is extremely useful. Since faster scrubbing can increase the radiation tolerances of the configuration memories on FPGAs, optical high-speed scrubbing using optically reconfigurable gate array (ORGA) architecture is introduced. Up to now, major scrubbing operations have invariably used a single configuration context, but since the storage capacities of holographic memories on ORGAs are high, many configuration contexts can be stored on a holographic memory. Thereby, various configuration contexts that avoid permanent failures can be used cyclically for scrubbing operations. Even if a permanent failure occurs on the programmable gate array during scrubbing operations, which exploit numerous configuration contexts, correct operations can be executed.
AB - Two salient concerns of current field programmable gate arrays (FPGAs) used for space applications are how to block soft errors that arise on their configuration memories and how to treat permanent failures attributable to total dose effects. To date, those two main concerns have been treated separately, but we present a proposal for multi-context scrubbing to 'kill two birds with one stone' and resolve both issues simultaneously. To decrease the frequency of soft errors arising on the configuration memories of FPGAs, applying scrubbing operations for configuration memories is extremely useful. Since faster scrubbing can increase the radiation tolerances of the configuration memories on FPGAs, optical high-speed scrubbing using optically reconfigurable gate array (ORGA) architecture is introduced. Up to now, major scrubbing operations have invariably used a single configuration context, but since the storage capacities of holographic memories on ORGAs are high, many configuration contexts can be stored on a holographic memory. Thereby, various configuration contexts that avoid permanent failures can be used cyclically for scrubbing operations. Even if a permanent failure occurs on the programmable gate array during scrubbing operations, which exploit numerous configuration contexts, correct operations can be executed.
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U2 - 10.1109/MWSCAS.2017.8053231
DO - 10.1109/MWSCAS.2017.8053231
M3 - Conference contribution
AN - SCOPUS:85034084436
T3 - Midwest Symposium on Circuits and Systems
SP - 1548
EP - 1551
BT - 2017 IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 60th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2017
Y2 - 6 August 2017 through 9 August 2017
ER -