Nonlinear modeling and analysis on concurrent amplification of dual-band gaussian signals

Ikuma Ando, Gia Khanh Tran, Kiyomichi Araki, Takayuki Yamada, Takana Kaho, Yo Yamaguchi, Kazuhiro Uehara

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In the recently developed Flexible Wireless System (FWS), the same platform needs to deal with different wireless systems. This increases nonlinear distortion in its wideband power amplifier (PA) because the PA needs to concurrently amplify multi-band signals. By taking higher harmonics as well as inter- and cross-modulation distortion into consideration, we have developed a method to analytically evaluate the adjacent channel leakage power ratio (ACPR) and error vector magnitude (EVM) on the basis of the PA's nonlinear characteristics. We devise a novel method for modeling the PA amplifying dual-band signals. The method makes it possible to model it merely by performing a one-tone test, making use of the Volterra series expansion and the generalWiener model. We then use the Mehler formula to derive the closed-form expressions of the PA's output power spectral density (PSD), ACPR, and EVM. The derivations are based on the assumption that the transmitted signals are complex Gaussian distributed in orthogonal frequency division multiplexing (OFDM) transmission systems. We validate the method by comparing measurement and simulation results and confirm it can appropriately predict the ACPR and EVM performance of the nonlinear PA output with OFDM inputs. In short, the method enables correct modeling of a wideband PA that amplifies dualband signals merely by conducting a one-tone test.

Original languageEnglish
Pages (from-to)1254-1262
Number of pages9
JournalIEICE Transactions on Electronics
VolumeE96-C
Issue number10
DOIs
Publication statusPublished - Oct 2013
Externally publishedYes

Keywords

  • ACPR
  • Complex Gaussian distribution
  • EVM
  • Flexible Wireless System
  • General Wiener model
  • Nonlinear power amplifier
  • OFDM
  • Spectral regrowth
  • Volterra series expansion

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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