TY - GEN
T1 - Optically reconfigurable gate array with a 1 Grad total-ionizing-dose tolerant holographic memory
AU - Ishido, Junya
AU - Watanabe, Minoru
AU - Ogiwara, Akifumi
N1 - Funding Information:
ACKNOWLEDGMENTS This research was partly supported by the Initiatives for Atomic Energy Basic and Generic Strategic Research No. JPJA19F19209710. The VLSI chip in this study was fabricated in the chip fabrication program of VLSI Design and Education Center (VDEC) of the University of Tokyo in collaboration with Rohm Co. Ltd. and Toppan Printing Co. Ltd.
Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - This paper presents a radiation-hardened optically reconfigurable gate array with a 1 Grad total-ionizing-dose tolerant holographic memory. The optical configuration procedure on the radiation-hardened optically reconfigurable gate array was confirmed experimentally using a 1 Grad total-ionizing-dose tolerant holographic memory.
AB - This paper presents a radiation-hardened optically reconfigurable gate array with a 1 Grad total-ionizing-dose tolerant holographic memory. The optical configuration procedure on the radiation-hardened optically reconfigurable gate array was confirmed experimentally using a 1 Grad total-ionizing-dose tolerant holographic memory.
KW - field programmable gate array (FPGA)
KW - holographic memory
KW - optically reconfigurable gate array
UR - http://www.scopus.com/inward/record.url?scp=85123201084&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85123201084&partnerID=8YFLogxK
U2 - 10.1109/IPC48725.2021.9592957
DO - 10.1109/IPC48725.2021.9592957
M3 - Conference contribution
AN - SCOPUS:85123201084
T3 - 2021 IEEE Photonics Conference, IPC 2021 - Proceedings
BT - 2021 IEEE Photonics Conference, IPC 2021 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 IEEE Photonics Conference, IPC 2021
Y2 - 18 October 2021 through 21 October 2021
ER -