Photoinduced surface roughness variation in polycrystalline TiO2 thin films under different atmospheres

Naoki Arimitsu; Akira Nakajima; Ken ichi Katsumata; Tadashi Shiota; Toshiya Watanabe; Naoya Yoshida; Yoshikazu Kameshima; Kiyoshi Okada

doi:10.1016/j.jphotochem.2007.03.013

Photoinduced surface roughness variation in polycrystalline TiO₂ thin films under different atmospheres

Naoki Arimitsu, Akira Nakajima, Ken ichi Katsumata, Tadashi Shiota, Toshiya Watanabe, Naoya Yoshida, Yoshikazu Kameshima, Kiyoshi Okada

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

For this study, we evaluated photoinduced surface roughness variation of polycrystalline anatase thin films under different atmospheres using atomic force microscopy (AFM). A TiO₂ thin film with large grains was prepared using the sol-gel process and vacuum ultraviolet (VUV) irradiation before firing. Upon UV illumination, the surface image became blurred with an apparent surface roughness increase in ambient air. The appearance of this image change was delayed in dry air, and was not observed in dry nitrogen. These results imply that this photoinduced surface change is related to water adsorption from the atmosphere.

Original language	English
Pages (from-to)	53-57
Number of pages	5
Journal	Journal of Photochemistry and Photobiology A: Chemistry
Volume	190
Issue number	1
DOIs	https://doi.org/10.1016/j.jphotochem.2007.03.013
Publication status	Published - Jul 5 2007
Externally published	Yes

Keywords

Atomic force microscopy
Surface roughness
Titanium dioxide

ASJC Scopus subject areas

Chemistry(all)
Chemical Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1016/j.jphotochem.2007.03.013

Cite this

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title = "Photoinduced surface roughness variation in polycrystalline TiO2 thin films under different atmospheres",

abstract = "For this study, we evaluated photoinduced surface roughness variation of polycrystalline anatase thin films under different atmospheres using atomic force microscopy (AFM). A TiO2 thin film with large grains was prepared using the sol-gel process and vacuum ultraviolet (VUV) irradiation before firing. Upon UV illumination, the surface image became blurred with an apparent surface roughness increase in ambient air. The appearance of this image change was delayed in dry air, and was not observed in dry nitrogen. These results imply that this photoinduced surface change is related to water adsorption from the atmosphere.",

keywords = "Atomic force microscopy, Surface roughness, Titanium dioxide",

author = "Naoki Arimitsu and Akira Nakajima and Katsumata, {Ken ichi} and Tadashi Shiota and Toshiya Watanabe and Naoya Yoshida and Yoshikazu Kameshima and Kiyoshi Okada",

note = "Funding Information: The present research was supported in part by a grant from the Ministry of Education, Culture, Sports, Science and Technology of Japan (#17029017).",

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doi = "10.1016/j.jphotochem.2007.03.013",

language = "English",

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journal = "Journal of Photochemistry and Photobiology A: Chemistry",

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TY - JOUR

T1 - Photoinduced surface roughness variation in polycrystalline TiO2 thin films under different atmospheres

AU - Arimitsu, Naoki

AU - Nakajima, Akira

AU - Katsumata, Ken ichi

AU - Shiota, Tadashi

AU - Watanabe, Toshiya

AU - Yoshida, Naoya

AU - Kameshima, Yoshikazu

AU - Okada, Kiyoshi

N1 - Funding Information: The present research was supported in part by a grant from the Ministry of Education, Culture, Sports, Science and Technology of Japan (#17029017).

PY - 2007/7/5

Y1 - 2007/7/5

N2 - For this study, we evaluated photoinduced surface roughness variation of polycrystalline anatase thin films under different atmospheres using atomic force microscopy (AFM). A TiO2 thin film with large grains was prepared using the sol-gel process and vacuum ultraviolet (VUV) irradiation before firing. Upon UV illumination, the surface image became blurred with an apparent surface roughness increase in ambient air. The appearance of this image change was delayed in dry air, and was not observed in dry nitrogen. These results imply that this photoinduced surface change is related to water adsorption from the atmosphere.

AB - For this study, we evaluated photoinduced surface roughness variation of polycrystalline anatase thin films under different atmospheres using atomic force microscopy (AFM). A TiO2 thin film with large grains was prepared using the sol-gel process and vacuum ultraviolet (VUV) irradiation before firing. Upon UV illumination, the surface image became blurred with an apparent surface roughness increase in ambient air. The appearance of this image change was delayed in dry air, and was not observed in dry nitrogen. These results imply that this photoinduced surface change is related to water adsorption from the atmosphere.

KW - Atomic force microscopy

KW - Surface roughness

KW - Titanium dioxide

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