Planar defects in the new superconducting oxide (Eu1-xCex)2(Ba1-yEuy)2Cu3Ozobserved by high-resolution transmission electron microscopy

Yoshio Matsui; Shigeo Horiuchi; Hiroshi Sawa; Kazuhiko Obara; Jun Akimitsu

doi:10.1143/JJAP.28.L1555

Planar defects in the new superconducting oxide (Eu_1-xCe_x)₂(Ba_1-yEu_y)₂Cu₃O_zobserved by high-resolution transmission electron microscopy

Yoshio Matsui, Shigeo Horiuchi, Hiroshi Sawa, Kazuhiko Obara, Jun Akimitsu

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

Planar defects in the 2-2-3 type of new superconducting oxide, R₂B₂Cu₃O_z[R is (Eu_1-xCe_x), (Ba_1-yEu_y); x and y are about 0.33 and z is about 8.54], recently discovered by Sawa et al. (to be published in J. Phys. Soc. Jpn.) are examined by high-resolution transmission electron microscopy. The planar defects are derived by the local replacements of R₂O₂-layers by R-layers to form defect stabs of 1.2 nm thickness, having local structure similar to that of RBa₂Cu₃O_y.

Original language	English
Pages (from-to)	L1555-L1557
Journal	Japanese Journal of Applied Physics
Volume	28
Issue number	9 A
DOIs	https://doi.org/10.1143/JJAP.28.L1555
Publication status	Published - Sept 1 1989
Externally published	Yes

Keywords

2-2-3 compound
Ba-Eu-Ce-Cu-0 system
Intergrowth
Planar defects
Superconducting oxide

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/JJAP.28.L1555

Cite this

@article{8677121309c74526954166ff49797959,

title = "Planar defects in the new superconducting oxide (Eu1-xCex)2(Ba1-yEuy)2Cu3Ozobserved by high-resolution transmission electron microscopy",

abstract = "Planar defects in the 2-2-3 type of new superconducting oxide, R2B2Cu3Oz[R is (Eu1-xCex), (Ba1-yEuy); x and y are about 0.33 and z is about 8.54], recently discovered by Sawa et al. (to be published in J. Phys. Soc. Jpn.) are examined by high-resolution transmission electron microscopy. The planar defects are derived by the local replacements of R2O2-layers by R-layers to form defect stabs of 1.2 nm thickness, having local structure similar to that of RBa2Cu3Oy.",

keywords = "2-2-3 compound, Ba-Eu-Ce-Cu-0 system, Intergrowth, Planar defects, Superconducting oxide",

author = "Yoshio Matsui and Shigeo Horiuchi and Hiroshi Sawa and Kazuhiko Obara and Jun Akimitsu",

year = "1989",

month = sep,

day = "1",

doi = "10.1143/JJAP.28.L1555",

language = "English",

volume = "28",

pages = "L1555--L1557",

journal = "Japanese Journal of Applied Physics",

issn = "0021-4922",

publisher = "INSTITUTE OF PURE AND APPLIED PHYSICS",

number = "9 A",

}

TY - JOUR

T1 - Planar defects in the new superconducting oxide (Eu1-xCex)2(Ba1-yEuy)2Cu3Ozobserved by high-resolution transmission electron microscopy

AU - Matsui, Yoshio

AU - Horiuchi, Shigeo

AU - Sawa, Hiroshi

AU - Obara, Kazuhiko

AU - Akimitsu, Jun

PY - 1989/9/1

Y1 - 1989/9/1

N2 - Planar defects in the 2-2-3 type of new superconducting oxide, R2B2Cu3Oz[R is (Eu1-xCex), (Ba1-yEuy); x and y are about 0.33 and z is about 8.54], recently discovered by Sawa et al. (to be published in J. Phys. Soc. Jpn.) are examined by high-resolution transmission electron microscopy. The planar defects are derived by the local replacements of R2O2-layers by R-layers to form defect stabs of 1.2 nm thickness, having local structure similar to that of RBa2Cu3Oy.

AB - Planar defects in the 2-2-3 type of new superconducting oxide, R2B2Cu3Oz[R is (Eu1-xCex), (Ba1-yEuy); x and y are about 0.33 and z is about 8.54], recently discovered by Sawa et al. (to be published in J. Phys. Soc. Jpn.) are examined by high-resolution transmission electron microscopy. The planar defects are derived by the local replacements of R2O2-layers by R-layers to form defect stabs of 1.2 nm thickness, having local structure similar to that of RBa2Cu3Oy.

KW - 2-2-3 compound

KW - Ba-Eu-Ce-Cu-0 system

KW - Intergrowth

KW - Planar defects

KW - Superconducting oxide

UR - http://www.scopus.com/inward/record.url?scp=0024738498&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024738498&partnerID=8YFLogxK

U2 - 10.1143/JJAP.28.L1555

DO - 10.1143/JJAP.28.L1555

M3 - Article

AN - SCOPUS:0024738498

SN - 0021-4922

VL - 28

SP - L1555-L1557

JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

IS - 9 A

ER -