Polarization dependence of the soft X-ray Raman scattering at the L edge of TiO2

Y. Harada, M. Watanabe, R. Eguchi, Y. Ishiwata, M. Matsubara, A. Kotani, A. Yagishita, S. Shin

Research output: Contribution to journalConference articlepeer-review

8 Citations (Scopus)


Polarization dependence of the soft X-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering features appear about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibonding state between 3d1L and 3d0 states, because they are enhanced when the incident photon energies are tuned at satellite structures of Ti 2p absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They show weak polarization dependence and are assigned to be nonbonding type charge transfer excitations.

Original languageEnglish
Pages (from-to)969-973
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Publication statusPublished - Mar 2001
Externally publishedYes
Event8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA
Duration: Aug 8 2000Aug 12 2000

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry


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