Abstract
Lithium niobate (LiNbO3) thin films were deposited on Al 2O3(001) substrates using metal-organic chemical vapor deposition (MOCVD), with Li(dpm) and Nb(C2H5)5 as precursors. By optimizing the conditions of thin film deposition, the c-axis oriented and epitaxially grown LiNbO3 thin films with stoichiometric composition were deposited on an Al2O3(001) substrate. The refractive index of the stoichiometric LiNbO3 thin film was 2.24 at λ = 632.8 nm, which is close to that of bulk crystal.
Original language | English |
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Pages (from-to) | 179-182 |
Number of pages | 4 |
Journal | Key Engineering Materials |
Volume | 388 |
Publication status | Published - Jan 1 2009 |
Externally published | Yes |
Keywords
- Epitaxial film
- LiNbO
- MOCVD
- Optical property
- Refractive index
- Thin film
ASJC Scopus subject areas
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering