| Original language | English |
|---|---|
| Pages (from-to) | 14-19 |
| Number of pages | 6 |
| Journal | Proc. Second Asian Test Symposium (ATS ''93) |
| Publication status | Published - 1993 |
Proof that Akers'' Algorithm for Locally Exhaustive Testing Gives Minimum Test Set of Combinational Circuits with up to Four Outputs
Research output: Contribution to journal › Article