Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

H. Michinishi; T. Yokohira; T. Okamoto

doi:10.1109/ATS.1993.398773

Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

H. Michinishi, T. Yokohira, T. Okamoto

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT.

Original language	English
Title of host publication	ATS 1993 Proceedings - 2nd Asian Test Symposium
Publisher	IEEE Computer Society
Pages	14-19
Number of pages	6
ISBN (Electronic)	081863930X
DOIs	https://doi.org/10.1109/ATS.1993.398773
Publication status	Published - 1993
Event	2nd IEEE Asian Test Symposium, ATS 1993 - Beijing, China Duration: Nov 16 1993 → Nov 18 1993

Publication series

Name	Proceedings of the Asian Test Symposium
ISSN (Print)	1081-7735

Conference

Conference	2nd IEEE Asian Test Symposium, ATS 1993
Country/Territory	China
City	Beijing
Period	11/16/93 → 11/18/93

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ATS.1993.398773

Cite this

Michinishi, H., Yokohira, T., & Okamoto, T. (1993). Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs. In ATS 1993 Proceedings - 2nd Asian Test Symposium (pp. 14-19). Article 398773 (Proceedings of the Asian Test Symposium). IEEE Computer Society. https://doi.org/10.1109/ATS.1993.398773

Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs. / Michinishi, H.; Yokohira, T.; Okamoto, T.
ATS 1993 Proceedings - 2nd Asian Test Symposium. IEEE Computer Society, 1993. p. 14-19 398773 (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Michinishi, H, Yokohira, T & Okamoto, T 1993, Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs. in ATS 1993 Proceedings - 2nd Asian Test Symposium., 398773, Proceedings of the Asian Test Symposium, IEEE Computer Society, pp. 14-19, 2nd IEEE Asian Test Symposium, ATS 1993, Beijing, China, 11/16/93. https://doi.org/10.1109/ATS.1993.398773

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author = "H. Michinishi and T. Yokohira and T. Okamoto",

note = "Publisher Copyright: {\textcopyright} 1993 IEEE.; 2nd IEEE Asian Test Symposium, ATS 1993 ; Conference date: 16-11-1993 Through 18-11-1993",

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Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

Abstract

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ASJC Scopus subject areas

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