Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array

Takumi Fujimori; Minoru Watanabe

doi:10.1109/SOCC.2017.8226014

Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Recently, field programmable gate arrays (FPGAs) are anticipated for use in high-radiation environments such as the Fukushima Daiichi nuclear power plant. According to recent news, regions with 650 Sv/h radiation have been found at the Fukushima Daiichi nuclear power plant. Under such extremely high radiation environments, high-speed scrubbing operations must be used to maintain correct circuit information on the configuration memory of programmable gate arrays. Up to now, optical high-speed scrubbing based on an optically reconfigurable gate array has been proposed. This paper presents a demonstration of the radiation tolerance of the optical high-speed scrubbing based on an optically reconfigurable gate array VLSI by using lasers that emulate strong radiation environments. It has been confirmed that 70-ns period high-speed scrubbing operations on the optically reconfigurable gate array are never disturbed by the emulated radiation.

Original language	English
Title of host publication	Proceedings - 30th IEEE International System on Chip Conference, SOCC 2017
Editors	Jurgen Becker, Ramalingam Sridhar, Hai Li, Ulf Schlichtmann, Massimo Alioto
Publisher	IEEE Computer Society
Pages	91-95
Number of pages	5
ISBN (Electronic)	9781538640333
DOIs	https://doi.org/10.1109/SOCC.2017.8226014
Publication status	Published - Dec 18 2017
Externally published	Yes
Event	30th IEEE International System on Chip Conference, SOCC 2017 - Munich, Germany Duration: Sept 5 2017 → Sept 8 2017

Publication series

Name	International System on Chip Conference
Volume	2017-September
ISSN (Print)	2164-1676
ISSN (Electronic)	2164-1706

Conference

Conference	30th IEEE International System on Chip Conference, SOCC 2017
Country/Territory	Germany
City	Munich
Period	9/5/17 → 9/8/17

ASJC Scopus subject areas

Hardware and Architecture
Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/SOCC.2017.8226014

Cite this

Fujimori, T., & Watanabe, M. (2017). Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array. In J. Becker, R. Sridhar, H. Li, U. Schlichtmann, & M. Alioto (Eds.), Proceedings - 30th IEEE International System on Chip Conference, SOCC 2017 (pp. 91-95). (International System on Chip Conference; Vol. 2017-September). IEEE Computer Society. https://doi.org/10.1109/SOCC.2017.8226014

Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array. / Fujimori, Takumi; Watanabe, Minoru.
Proceedings - 30th IEEE International System on Chip Conference, SOCC 2017. ed. / Jurgen Becker; Ramalingam Sridhar; Hai Li; Ulf Schlichtmann; Massimo Alioto. IEEE Computer Society, 2017. p. 91-95 (International System on Chip Conference; Vol. 2017-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fujimori, T & Watanabe, M 2017, Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array. in J Becker, R Sridhar, H Li, U Schlichtmann & M Alioto (eds), Proceedings - 30th IEEE International System on Chip Conference, SOCC 2017. International System on Chip Conference, vol. 2017-September, IEEE Computer Society, pp. 91-95, 30th IEEE International System on Chip Conference, SOCC 2017, Munich, Germany, 9/5/17. https://doi.org/10.1109/SOCC.2017.8226014

Fujimori T, Watanabe M. Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array. In Becker J, Sridhar R, Li H, Schlichtmann U, Alioto M, editors, Proceedings - 30th IEEE International System on Chip Conference, SOCC 2017. IEEE Computer Society. 2017. p. 91-95. (International System on Chip Conference). doi: 10.1109/SOCC.2017.8226014

Fujimori, Takumi ; Watanabe, Minoru. / Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array. Proceedings - 30th IEEE International System on Chip Conference, SOCC 2017. editor / Jurgen Becker ; Ramalingam Sridhar ; Hai Li ; Ulf Schlichtmann ; Massimo Alioto. IEEE Computer Society, 2017. pp. 91-95 (International System on Chip Conference).

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abstract = "Recently, field programmable gate arrays (FPGAs) are anticipated for use in high-radiation environments such as the Fukushima Daiichi nuclear power plant. According to recent news, regions with 650 Sv/h radiation have been found at the Fukushima Daiichi nuclear power plant. Under such extremely high radiation environments, high-speed scrubbing operations must be used to maintain correct circuit information on the configuration memory of programmable gate arrays. Up to now, optical high-speed scrubbing based on an optically reconfigurable gate array has been proposed. This paper presents a demonstration of the radiation tolerance of the optical high-speed scrubbing based on an optically reconfigurable gate array VLSI by using lasers that emulate strong radiation environments. It has been confirmed that 70-ns period high-speed scrubbing operations on the optically reconfigurable gate array are never disturbed by the emulated radiation.",

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Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array

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