Recovery method for a laser array failure on dynamic optically reconfigurable gate arrays

Daisaku Seto; Minoru Watanabe

doi:10.1109/DFT.2010.55

Recovery method for a laser array failure on dynamic optically reconfigurable gate arrays

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Demand is increasing daily for a large-gate-count robust VLSI chip that can be used in a radiation-rich space environment. Since they exploit the large storage capacity of a holographic memory, optically reconfigurable gate arrays (ORGAs) have been developed to realize a much larger virtual gate count than those of current VLSI chips. The ORGA architecture is extremely robust for many failure modes caused by high-energy charged particles. Among such developments, dynamic optically reconfigurable gate arrays (DORGAs) have been developed to realize a high-gate-density VLSI using a photodiode memory architecture. Unfortunately, the DORGA architecture is more sensitive to the unallowable turn-off failure mode of a laser array. Therefore, this paper presents a recovery method for a turn-off failure mode of a laser array on a DORGA and its demonstration results.

Original language	English
Title of host publication	Proceedings - 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010
Pages	411-419
Number of pages	9
DOIs	https://doi.org/10.1109/DFT.2010.55
Publication status	Published - 2010
Externally published	Yes
Event	2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010 - Kyoto, Japan Duration: Oct 6 2010 → Oct 8 2010

Publication series

Name	Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)	1550-5774

Conference

Conference	2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010
Country/Territory	Japan
City	Kyoto
Period	10/6/10 → 10/8/10

Keywords

Defect tolerance
Field programmable gate arrays
Laser arrays
Optically reconfigurable gate arrays

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/DFT.2010.55

Cite this

Seto, D., & Watanabe, M. (2010). Recovery method for a laser array failure on dynamic optically reconfigurable gate arrays. In Proceedings - 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010 (pp. 411-419). [5634942] (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems). https://doi.org/10.1109/DFT.2010.55

Recovery method for a laser array failure on dynamic optically reconfigurable gate arrays. / Seto, Daisaku; Watanabe, Minoru.
Proceedings - 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010. 2010. p. 411-419 5634942 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Seto, D & Watanabe, M 2010, Recovery method for a laser array failure on dynamic optically reconfigurable gate arrays. in Proceedings - 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010., 5634942, Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 411-419, 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, 10/6/10. https://doi.org/10.1109/DFT.2010.55

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Recovery method for a laser array failure on dynamic optically reconfigurable gate arrays

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Keywords

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