SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials

Jiro Matsuo, Satoshi Ninomiya, Hideaki Yamada, Kazuya Ichiki, Yoshinobu Wakamatsu, Masaki Hada, Toshio Seki, Takaaki Aoki

    Research output: Contribution to journalArticlepeer-review

    26 Citations (Scopus)

    Abstract

    Recent developments in SIMS with both Ar cluster ions and swift heavy ions are presented. With these primary beams, the analysis of organic semiconductors and animal cells shows that one of the key factors to realizing the SIMS analysis of organic materials is high-energy deposition near the surface. Molecular depth profiling and images of organic materials were demonstrated by using SIMS.

    Original languageEnglish
    Pages (from-to)1612-1615
    Number of pages4
    JournalSurface and Interface Analysis
    Volume42
    Issue number10-11
    DOIs
    Publication statusPublished - Oct 2010

    Keywords

    • Cluster ion beam
    • Molecular depth profiling
    • SIMS
    • Swift heavy ion beam

    ASJC Scopus subject areas

    • General Chemistry
    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

    Fingerprint

    Dive into the research topics of 'SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials'. Together they form a unique fingerprint.

    Cite this