Abstract
The structure of the conductive Langmuir-Blodgett (LB) film consisting of tridecylmethylammonium-Au(dmit)2 (3C10-Au) and arachidic acid is studied by the X-ray diffraction method and atomic force microscopy (AFM). The electrochemically ClO-4-doped film is found to possess four phases with different interlayer spacings by the X-ray diffraction method. The intralayer molecular arrangement is found for the 3C10-Au matrix by AFM.
Original language | English |
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Pages (from-to) | 251-255 |
Number of pages | 5 |
Journal | Synthetic Metals |
Volume | 74 |
Issue number | 3 |
DOIs | |
Publication status | Published - Oct 1995 |
Keywords
- Au(dmit)
- Conductive films
- Langmuir-Blodgett film
- Microscopy
- Tridecylmethylammonium
- X-ray diffraction
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys
- Materials Chemistry