Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.
|Proceedings of Science
|Published - Dec 1 2012
|3rd International Workshop on New Photon-Detectors, PhotoDet 2012 - Orsay, France
Duration: Jun 13 2012 → Jun 15 2012
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