Abstract
The minimum thickness for an amorphous silicon dioxide (α-SiO2) protective coating required to prevent volume diffusion of atomic oxygen in a low Earth orbit (LEO) was evaluated by measuring the oxide thickness formed on Si (001) wafers in a hyperthermal atomic oxygen beam. The thickness of oxide film was measured with X-ray photoelectron spectroscopy. The diffusion length of atomic oxygen in α-SiO2 at temperatures between 297 K to 493 K, where exterior surfaces of a spacecraft may be heated in LEO, shows temperature and flux dependencies. The ground-based testing condition to evaluate performances of protective coatings will also be discussed.
| Original language | English |
|---|---|
| Pages (from-to) | I/- |
| Journal | International SAMPE Symposium and Exhibition (Proceedings) |
| Volume | 44 |
| Publication status | Published - 1999 |
| Event | Proceedings of the 1999 44th International SAMPE Symposium and Exhibition 'Envolving and Revolutionary Technologies for the New Millennium', SAMPE '99 - Long Beach, CA, USA Duration: May 23 1999 → May 27 1999 |
ASJC Scopus subject areas
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering