TY - GEN
T1 - Wide range dielectric spectroscopy of barium strontium titanate ceramics
AU - Teranishi, Takashi
AU - Hoshina, Takuya
AU - Takeda, Hiroaki
AU - Tsurumi, Takaaki
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2010
Y1 - 2010
N2 - Wide band dielectric spectroscopy was applied from kHz to THz region for the analysis of both the ionic and the dipole polarization in Ba 0.6Sr0.4TiO3 ceramics. The dielectric permittivity above the dielectric maximum temperature (Tm) is mostly dominated by the ionic polarization, while that below Tm is governed by the dipole polarization. Dielectric permittivity given by the dipole polarization increased and the relaxation frequency decreased with decreasing temperature. These phenomena are related to a increase of the size of polar nanoregions (PNRs).
AB - Wide band dielectric spectroscopy was applied from kHz to THz region for the analysis of both the ionic and the dipole polarization in Ba 0.6Sr0.4TiO3 ceramics. The dielectric permittivity above the dielectric maximum temperature (Tm) is mostly dominated by the ionic polarization, while that below Tm is governed by the dipole polarization. Dielectric permittivity given by the dipole polarization increased and the relaxation frequency decreased with decreasing temperature. These phenomena are related to a increase of the size of polar nanoregions (PNRs).
KW - Barium strontium titanate
KW - Dielectric spectroscopy
KW - Ferroelectrics
KW - Polar nanoregion
UR - http://www.scopus.com/inward/record.url?scp=75749112064&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=75749112064&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/KEM.421-422.273
DO - 10.4028/www.scientific.net/KEM.421-422.273
M3 - Conference contribution
AN - SCOPUS:75749112064
SN - 0878493069
SN - 9780878493067
T3 - Key Engineering Materials
SP - 273
EP - 276
BT - Asian Ceramic Science for Electronics III and Electroceramics in Japan XII
PB - Trans Tech Publications Ltd
T2 - 6th Asian Meeting on Electroceramics, AMEC-6, in conjunction with the Electronics Division Meeting of the Ceramic Society of Japan
Y2 - 22 October 2008 through 24 October 2008
ER -