Angle-resolved photoemission study of Si electronic structure: Boron concentration dependence

Takanori Wakita, Hiroyuki Okazaki, Yoshihiko Takano, Masaaki Hirai, Yuji Muraoka, Takayoshi Yokoya

研究成果査読

1 被引用数 (Scopus)

抄録

The boron concentration dependence of the Si electronic structure of Si(1 0 0)2 × 1 surfaces were investigated by angle-resolved photoemission spectroscopy (ARPES). The ARPES spectra exhibit rigid shifts toward lower binding energy as the boron concentration increases. The band dispersion was obtained from fitting procedure, and it is found that the top of the valence band does not exceed the Fermi level even with a boron concentration 35 times larger than the critical concentration of the metal-insulator transition.

本文言語English
ページ(範囲)S641-S643
ジャーナルPhysica C: Superconductivity and its applications
470
SUPPL.1
DOI
出版ステータスPublished - 12月 2010

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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