Frequency doubling in gallium-lanthanum-sulphide glass with surface crystallized Ga6La10/3S14 thin films

Yong Ding; Atsuhiro Kondoh; Yoshinari Miura; Tokuro Nanba

doi:10.1063/1.121985

Frequency doubling in gallium-lanthanum-sulphide glass with surface crystallized Ga₆La_10/3S₁₄ thin films

Yong Ding
, Atsuhiro Kondoh
, Yoshinari Miura
, Tokuro Nanba

研究成果 › 査読

5 被引用数 (Scopus)

抄録

The reason for the optical frequency doubling in the 70Ga₂S₃-30La₂S₃ glass is investigated. The tetragonal Ga₆La_10/3S₁₄ phase due to crystallization of the glass is responsible for the frequency doubling. Dense and transparent Ga₆La_10/3S₁₄ crystalline thin films have been prepared by means of the controlled surface treatment of the glass due to an ultrasonic surface treatment. The effective second-order nonlinear optical susceptibilities of the crystalline thin films are analyzed.

本文言語	English
ページ（範囲）	738-740
ページ数	3
ジャーナル	Applied Physics Letters
巻	73
号	6
DOI	https://doi.org/10.1063/1.121985
出版ステータス	Published - 1998

ASJC Scopus subject areas

物理学および天文学（その他）

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10.1063/1.121985

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引用スタイル

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abstract = "The reason for the optical frequency doubling in the 70Ga2S3-30La2S3 glass is investigated. The tetragonal Ga6La10/3S14 phase due to crystallization of the glass is responsible for the frequency doubling. Dense and transparent Ga6La10/3S14 crystalline thin films have been prepared by means of the controlled surface treatment of the glass due to an ultrasonic surface treatment. The effective second-order nonlinear optical susceptibilities of the crystalline thin films are analyzed.",

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AU - Nanba, Tokuro

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Y1 - 1998

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AB - The reason for the optical frequency doubling in the 70Ga2S3-30La2S3 glass is investigated. The tetragonal Ga6La10/3S14 phase due to crystallization of the glass is responsible for the frequency doubling. Dense and transparent Ga6La10/3S14 crystalline thin films have been prepared by means of the controlled surface treatment of the glass due to an ultrasonic surface treatment. The effective second-order nonlinear optical susceptibilities of the crystalline thin films are analyzed.

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