TY - JOUR
T1 - Fundamental study on electrical discharge machining of single crystalline silicon
AU - Uno, Yoshiyuki
AU - Okada, Akira
AU - Nakanishi, Hirohilo
AU - Okamoto, Yasuhiro
N1 - Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 1997
Y1 - 1997
N2 - Single crystalline silicon is one of the most important materials in semiconductor industry because of its superior properties as semiconductor. However, single crystalline silicon is difficult to machine precisely by conventional method because of its fragility. More complex, minute and three-dimensional shape will be required in the near future. From these points of view, electrical discharge machining (EDM) might be used for machining of single crystalline silicon because of very small machining force. In this study, the possibility of EDM for single crystalline silicon is experimentally investigated. The experimental results pointed it out that EDM for single crystalline silicon could be carried out when its resistivity was less than 10-2Ω · cm. The removal volume of crater of silicon in a single pulse discharge was much larger than that of steel because of its low boiling point and the important role of Joule's heat generation in material removal. Therefore, the removal rate of single crystalline silicon was much higher than that of SK3. Furthermore, the electrode wear in EDM of single crystalline silicon was lower than that of SK3 and no electrode wear EDM was possible under the appropriate condition with kerosine type fluid.
AB - Single crystalline silicon is one of the most important materials in semiconductor industry because of its superior properties as semiconductor. However, single crystalline silicon is difficult to machine precisely by conventional method because of its fragility. More complex, minute and three-dimensional shape will be required in the near future. From these points of view, electrical discharge machining (EDM) might be used for machining of single crystalline silicon because of very small machining force. In this study, the possibility of EDM for single crystalline silicon is experimentally investigated. The experimental results pointed it out that EDM for single crystalline silicon could be carried out when its resistivity was less than 10-2Ω · cm. The removal volume of crater of silicon in a single pulse discharge was much larger than that of steel because of its low boiling point and the important role of Joule's heat generation in material removal. Therefore, the removal rate of single crystalline silicon was much higher than that of SK3. Furthermore, the electrode wear in EDM of single crystalline silicon was lower than that of SK3 and no electrode wear EDM was possible under the appropriate condition with kerosine type fluid.
KW - EDM
KW - High resistivity
KW - Removal rate
KW - Single crystalline silicon
KW - Single pulse discharge
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U2 - 10.2493/jjspe.63.1459
DO - 10.2493/jjspe.63.1459
M3 - Article
AN - SCOPUS:0031244652
SN - 0912-0289
VL - 63
SP - 1459
EP - 1463
JO - Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
JF - Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
IS - 10
ER -