High-resolution synchrotron X-ray powder diffraction and Rietveld structure refinement of two (Mg0.95,Fe0.05)SiO3 perovskite samples synthesized under different oxygen fugacity conditions

A. P. Jephcoat, J. A. Hriljac, C. A. McCammon, H. St C. O'Neill, D. C. Rubie, L. W. Finger

    研究成果 › 査読

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    「High-resolution synchrotron X-ray powder diffraction and Rietveld structure refinement of two (Mg0.95,Fe0.05)SiO3 perovskite samples synthesized under different oxygen fugacity conditions」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    Physics & Astronomy

    Earth & Environmental Sciences

    Chemical Compounds