研究成果
}
TY - JOUR
T1 - Image Analysis Techniques for the Detection of Defectsat BGA by X-Ray
AU - Gotou, Sachiko
PY - 2003
Y1 - 2003
M3 - Article
VL - 2003
SP - 85
EP - 88
JO - ADC Modeling and Testing
JF - ADC Modeling and Testing
ER -